Measurements of radiation induced defects in quartz material by Dielectric Relaxation Spectroscopy

Autor: Christophe Inguimbert, N. Prud'homme, J.C. Giuntini, Sabine Devautour-Vinot, Olivier Cambon
Přispěvatelé: Institut Charles Gerhardt Montpellier - Institut de Chimie Moléculaire et des Matériaux de Montpellier (ICGM ICMMM), Ecole Nationale Supérieure de Chimie de Montpellier (ENSCM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Université Montpellier 1 (UM1)-Université Montpellier 2 - Sciences et Techniques (UM2)-Institut de Chimie du CNRS (INC), ONERA - The French Aerospace Lab [Châtillon], ONERA-Université Paris Saclay (COmUE)
Rok vydání: 2007
Předmět:
Zdroj: Proceeding of the International joint meeting EFTF•IEEE-FCS'07
Proceeding of the International joint meeting EFTF*IEEE-FCS'07, Time Nav 2007
International joint meeting EFTF*IEEE-FCS'07, Time Nav 2007
International joint meeting EFTF*IEEE-FCS'07, Time Nav 2007, May 2007, Genêve, Switzerland. pp.172
ISSN: 1075-6787
DOI: 10.1109/freq.2007.4319057
Popis: This paper presents the continuation of the results obtained in the R&D study initiated by the Centre National d'Etudes Spatiales (CNES) and presented during the last Frequency Control Symposium in 2006. This concerns more particularly the characterization of the defects in quartz material by using the Dielectric Relaxation Spectroscopy technique. Five different kinds (4 synthetic and one natural) of quartz material have been investigated. DRS measurements have been performed before and after three different irradiation doses (100 krad, 1 Mrad and 10 Mrad). The irradiation exposure yields in all cases the defects in the materials more instable. No dose level effect has been established. An annealing process (450degC during 24 hours) after irradiation cures to the damages produced in the quartz material by the irradiation dose.
Databáze: OpenAIRE