Low-energy electron diffraction study of the reconstruction and orientational stability of Si(331)

Autor:	Robert L. Park, Jian Wei, Ellen D. Williams
Rok vydání:	1991
Předmět:	Phase transition Silicon Low-energy electron diffraction Chemistry chemistry.chemical_element Surfaces and Interfaces Condensed Matter Physics Molecular physics Surfaces Coatings and Films Faceting Crystallography Electron diffraction Impurity Materials Chemistry Carbon Surface reconstruction
Zdroj:	Surface Science Letters. 250:L368-L372
ISSN:	0167-2584
DOI:	10.1016/0167-2584(91)90552-3
Popis:	Using low-energy electron diffraction, we have studied the reconstruction of Si(331). We find a previously unreported (12 × 1) reconstruction is characteristic of the clean surface; we present evident that a previously observed (13 × 1) reconstruction is not the equilibrium structure. The (12 × 1) reconstruction disorders via a strongly first-order phase transition at approximately 810°C. Heating carbon contaminated surfaces to about 950°C causes faceting to (111) and {17151} orientations.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9eae82ec066d64aa075ab16264de328d https://doi.org/10.1016/0167-2584(91)90552-3 Zobrazit plný text záznamu