Imaging Current Paths in Silicon Photovoltaic Devices with a Quantum Diamond Microscope
| Autor: | S.C. Scholten, G.J. Abrahams, B.C. Johnson, A.J. Healey, I.O. Robertson, D.A. Simpson, A. Stacey, S. Onoda, T. Ohshima, T.C. Kho, J. Ibarra Michel, J. Bullock, L.C.L. Hollenberg, J.-P. Tetienne |
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| Rok vydání: | 2022 |
| Předmět: | |
| Zdroj: | Physical Review Applied. 18 |
| ISSN: | 2331-7019 |
| Popis: | Magnetic imaging with nitrogen-vacancy centers in diamond, also known as quantum diamond microscopy, has emerged as a useful technique for the spatial mapping of charge currents in solid-state devices. In this work, we investigate an application to photovoltaic (PV) devices, where the currents are induced by light. We develop a widefield nitrogen-vacancy microscope that allows independent stimulus and measurement of the PV device, and test our system on a range of prototype crystalline silicon PV devices. We first demonstrate micrometer-scale vector magnetic field imaging of custom PV devices illuminated by a focused laser spot, revealing the internal current paths in both short-circuit and open-circuit conditions. We then demonstrate time-resolved imaging of photocurrents in an interdigitated back-contact solar cell, detecting current build-up and subsequent decay near the illumination point with microsecond resolution. This work presents a versatile and accessible analysis platform that may find distinct application in research on emerging PV technologies. 14 pages, 9 figures |
| Databáze: | OpenAIRE |
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