Differential electron scattering cross-sections at low electron energies: The influence of screening parameter
| Autor: | Milena Hugenschmidt, Dagmar Gerthsen, Martin Čalkovský, Erich Müller |
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| Rok vydání: | 2019 |
| Předmět: |
010302 applied physics
Range (particle radiation) Materials science Monte Carlo method 02 engineering and technology Electron 021001 nanoscience & nanotechnology 01 natural sciences Molecular physics Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials law.invention law 0103 physical sciences Scanning transmission electron microscopy Atomic number Electron microscope 0210 nano-technology Instrumentation Electron scattering Intensity (heat transfer) |
| Zdroj: | Ultramicroscopy. 207 |
| ISSN: | 1879-2723 |
| Popis: | For quantitative electron microscopy the comparison of measured and simulated data is essential. Monte Carlo (MC) simulations are well established to calculate the high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) intensities on a non-atomic scale. In this work we focus on the importance of the screening parameter in differential screened Rutherford cross-sections for MC simulations and on the contribution of the screening parameter to the atomic-number dependence of the HAADF-STEM intensity at electron energies ≤ 30 keV. Materials investigated were chosen to cover a wide range of atomic numbers Z to study the Z dependence of the screening parameter. Comparison of measured and simulated HAADF-STEM intensities with different screening parameters known from the literature were tested and failed to generally describe the experimental data. Hence, the screening parameter was adapted to obtain the best match between experimental and MC-simulated HAADF-STEM intensities. The Z dependence of the HAADF-STEM intensity was derived. |
| Databáze: | OpenAIRE |
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