Integrated optical addressing of a trapped ytterbium ion
| Autor: | H. J. McGuinness, L. P. Parazzoli, W. J. Setzer, N. Karl, Daniel Lynn Stick, M. Blain, Megan Ivory, Christopher T. DeRose, Michael Gehl |
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| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
Ytterbium
Quantum Physics Materials science Physics - Instrumentation and Detectors business.industry Atomic Physics (physics.atom-ph) Physics QC1-999 General Physics and Astronomy chemistry.chemical_element FOS: Physical sciences Physics::Optics Applied Physics (physics.app-ph) Instrumentation and Detectors (physics.ins-det) Physics - Applied Physics Ion Physics - Atomic Physics chemistry Optoelectronics Ion trap Physics::Atomic Physics business Quantum Physics (quant-ph) Quantum |
| Zdroj: | Physical Review X, Vol 11, Iss 4, p 041033 (2021) |
| Popis: | We report on the characterization of heating rates and photo-induced electric charging on a microfabricated surface ion trap with integrated waveguides. Microfabricated surface ion traps have received considerable attention as a quantum information platform due to their scalability and manufacturability. Here we characterize the delivery of 435 nm light through waveguides and diffractive couplers to a single ytterbium ion in a compact trap. We measure an axial heating rate at room temperature of $0.78\pm0.05$ q/ms and see no increase due to the presence of the waveguide. Furthermore, the electric field due to charging of the exposed dielectric outcoupler settles under normal operation after an initial shift. The frequency instability after settling is measured to be 0.9 kHz. 7 pages, 8 figures |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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