Submicrometric absolute positioning of flat reflective surfaces using Michelson interferometry
| Autor: | S. Payeur, C. Bienvenue, Patrizio Antici, S. Vallières |
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| Rok vydání: | 2020 |
| Předmět: |
Physics
business.industry Michelson interferometer 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences law.invention Numerical aperture 010309 optics Lens (optics) Interferometry Acceleration Optics law Position (vector) 0103 physical sciences 0210 nano-technology business Focus (optics) Instrumentation Beam (structure) |
| Zdroj: | The Review of scientific instruments. 90(12) |
| ISSN: | 1089-7623 |
| Popis: | We present a Target Positioning Interferometer (TPI), a system that uses variations of the wavefront curvature to position solid reflective surfaces with submicrometric precision. The TPI is a Michelson interferometer into which a lens is inserted in the target arm and the mirror of the reference arm is slightly tilted. The TPI configuration presented in this work allows us to position the surface of a reflective target on a beam focus within an uncertainty of 350 nm (2σ) in a subsecond timeframe, using a lens with a numerical aperture of NA = 0.20. We support our experimental findings with numerical simulations of the interference pattern using the ABCD matrices’ method, allowing us to define scaling laws for using the TPI with different optics and environments, as well as suggestions to improve the TPI accuracy and adapt the system to different applications. This system is very well suited for accurate and repeatable target positioning used in laser-driven ion acceleration, where a precise alignment is key to optimize the proton acceleration mechanism. |
| Databáze: | OpenAIRE |
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