Photoluminescence imaging of focused ion beam induced individual quantum dots
| Autor: | Deborah Tien, Vanessa Sih, Joanna Mirecki Millunchick, Jieun Lee, Timothy W. Saucer, Andrew J. Martin |
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| Rok vydání: | 2011 |
| Předmět: |
Materials science
Photoluminescence business.industry Phonon Mechanical Engineering Bioengineering General Chemistry Condensed Matter::Mesoscopic Systems and Quantum Hall Effect Condensed Matter Physics Focused ion beam law.invention Optics Thermal conductivity Confocal microscopy law Quantum dot Thermoelectric effect General Materials Science Emission spectrum business |
| Zdroj: | Nano letters. 11(3) |
| ISSN: | 1530-6992 |
| Popis: | We report on scanning microphotoluminescence measurements that spectrally and spatially resolve emission from individual InAs quantum dots that were induced by focused ion beam patterning. Multilayers of quantum dots were spaced 2 μm apart, with a minimum single dot emission line width of 160 μeV, indicating good optical quality for dots patterned using this technique. Mapping 16 array sites, at least 65% were occupied by optically active dots and the spectral inhomogeneity was within 30 meV. |
| Databáze: | OpenAIRE |
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