The influence of the surface topography on the magnetization dynamics in soft magnetic thin films
| Autor: | C.B. Craus, L. Niesen, D.O. Boerma, Georgios Palasantzas, J.Th.M. De Hosson, A.R. Chezan |
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| Přispěvatelé: | Applied Physics, Nanotechnology and Biophysics in Medicine (NANOBIOMED) |
| Jazyk: | angličtina |
| Rok vydání: | 2005 |
| Předmět: |
Magnetization dynamics
SPECTRUM Materials science Condensed matter physics Demagnetizing field General Physics and Astronomy Surface finish FERROMAGNETIC-RESONANCE Magnetic hysteresis Ferromagnetic resonance Nanocrystalline material Nuclear magnetic resonance ROUGH SURFACES HEIGHT-HEIGHT CORRELATION Surface roughness X-RAY SCATTERING PERMEABILITY Thin film RANDOM ANISOTROPY |
| Zdroj: | Journal of Applied Physics, 97(1):013904, 013904-1-013904-8. AMER INST PHYSICS |
| ISSN: | 0021-8979 |
| Popis: | In this work we study the influence of surface roughness on the magnetization dynamics of soft magnetic nanocrystalline Fe-Zr-N thin films deposited (under identical conditions) onto a Si oxide, a thin polymer layer, and a thin Cu layer. The substrate temperature during deposition was approximately -25 degreesC ensuring a nanocrystalline state. The demagnetizing factors due to sample roughness were calculated based on atomic force microscopy (AFM) analysis of the surface topography. A clear correlation between sample roughness and the width of the high-frequency response is observed. The local random demagnetizing field created by the nanocrystalline structure and the surface topography is responsible for the positive shift of the ferromagnetic resonance frequency. In addition, a pronounced effect of line broadening is induced by the surface topography at large wavelengths. Finally, we show a good agreement between the values of the average demagnetizing field 4piNM(S) as calculated from the AFM scans, and the values calculated from the frequency-dependent complex permeability measurements. |
| Databáze: | OpenAIRE |
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