Evidence for two types of radiation-induced trapped positive charge
| Autor: | Dennis Brown, R.K. Freitag, C. M. Dozier |
|---|---|
| Rok vydání: | 1994 |
| Předmět: |
Nuclear and High Energy Physics
Materials science Annealing (metallurgy) Oxide Trapping Molecular physics Crystallographic defect Electromagnetic radiation chemistry.chemical_compound Nuclear magnetic resonance Nuclear Energy and Engineering chemistry Radiation damage Field-effect transistor Electrical and Electronic Engineering Hot-carrier injection |
| Popis: | New experimental evidence is presented that supports a model that assumes two distinguishable types of positive oxide charge following x-irradiation. Two new experiments have been performed designed to separate the annealing properties of the two types of trapped positive charge. It is found that one type of trapped positive charge can be permanently removed at room temperature using substrate hot electron injection. The second type of trapped positive charge is found to be stable at temperatures up to 160/spl deg/C. > |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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