High Reliability Evaluation and Lifetime Prediction of 50 GHz Athermal AWG Module
| Autor: | Insu Jeon, Kwon-Seob Lim, Young-Sic Kim, Chong-Hee Yu, Kwang-Su Yun |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: |
Technology
Materials science accelerated test QH301-705.5 QC1-999 athermal Reliability (semiconductor) Wavelength-division multiplexing Range (statistics) DWDM Insertion loss General Materials Science Biology (General) Instrumentation QD1-999 Fluid Flow and Transfer Processes reliability business.industry Process Chemistry and Technology Physics General Engineering Atmospheric temperature range Engineering (General). Civil engineering (General) lifetime prediction Computer Science Applications Accelerated life testing Wavelength Chemistry Service life Optoelectronics TA1-2040 business |
| Zdroj: | Applied Sciences, Vol 11, Iss 11107, p 11107 (2021) Applied Sciences; Volume 11; Issue 23; Pages: 11107 |
| ISSN: | 2076-3417 |
| Popis: | A 96-channel (50 GHz-spacing) athermal AWG has been developed. It has a wide operating range due to reduced temperature dependence than conventional AWG. The temperature dependence of the center wavelength of the developed module satisfied the ±0.05 nm range in all channels in the temperature range of −40 °C to 85 °C, and the insertion loss variation was also less than ±0.5 dB. As a result of validating its reliability through tests based on Telcordia-GR-1209 and GR-1221, the temperature dependence of the center wavelength satisfied the ±0.022 nm range, and the insertion loss variation was also less than ±0.2 dB. Accelerated life testing showed an expected service life of over 36.7 years, ensuring long-term safety of communication quality in harsh indoor and outdoor environments. |
| Databáze: | OpenAIRE |
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