RRAM Random Number Generator Based on Train of Pulses
| Autor: | Alvaro Gomez-Pau, Liang Fang, Francesca Campabadal, Salvador Manich, Rosa Rodriguez-Montanes, Binbin Yang, D. Arumi, Mireia Bargallo Gonzalez |
|---|---|
| Přispěvatelé: | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica, Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: |
Hardware security module
TK7800-8360 Computer Networks and Communications Computer science random number generator 02 engineering and technology Seguretat informàtica 01 natural sciences RRAM Random number generator Informàtica::Seguretat informàtica [Àrees temàtiques de la UPC] Hardware security Computer security 0103 physical sciences Electronic engineering Ordinadors -- Dispositius de memòria Randomness tests Electrical and Electronic Engineering Randomness 010302 applied physics Memòria d'accés aleatori Enginyeria electrònica [Àrees temàtiques de la UPC] 021001 nanoscience & nanotechnology Computer storage devices Resistive random-access memory Hardware and Architecture Control and Systems Engineering Modulation Pulse-amplitude modulation Signal Processing NIST hardware security NVM TRNG Electronics 0210 nano-technology Reset (computing) |
| Zdroj: | Electronics Volume 10 Issue 15 UPCommons. Portal del coneixement obert de la UPC Universitat Politècnica de Catalunya (UPC) Electronics, Vol 10, Iss 1831, p 1831 (2021) |
| ISSN: | 2079-9292 |
| DOI: | 10.3390/electronics10151831 |
| Popis: | In this paper, the modulation of the conductance levels of resistive random access memory (RRAM) devices is used for the generation of random numbers by applying a train of RESET pulses. The influence of the pulse amplitude and width on the device resistance is also analyzed. For each pulse characteristic, the number of pulses required to drive the device to a particular resistance threshold is variable, and it is exploited to extract random numbers. Based on this behavior, a random number generator (RNG) circuit is proposed. To assess the performance of the circuit, the National Institute of Standards and Technology (NIST) randomness tests are applied to evaluate the randomness of the bitstreams obtained. The experimental results show that four random bits are simultaneously obtained, passing all the applied tests without the need for post-processing. The presented method provides a new strategy to generate random numbers based on RRAMs for hardware security applications. This research was supported in part by the Spanish Ministry of Science, Innovation and Universities under Grant PID2019-103869RB-C33/ AEI /10.13039/501100011033, and the FEDER program under Grant TEC2017-84321-C4-1-R. |
| Databáze: | OpenAIRE |
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