Observation of Electric-Field-Induced Structural Dislocations in a Ferroelectric Oxide
| Autor: | Sverre Magnus Selbach, Dennis Meier, Aleksander B. Mosberg, Edith Bourret, Didrik Rene Småbråten, Zewu Yan, Donald M. Evans, Per Erik Vullum, Theodor S. Holstad, Antonius T. J. van Helvoort |
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| Rok vydání: | 2021 |
| Předmět: |
Letter
Materials science Bioengineering semiconductors 02 engineering and technology Topological defect Condensed Matter::Materials Science Polarization Electric field Nano Electrical conductivity Nanotechnology ddc:530 General Materials Science Scanning transmission electron microscopy FOS: Nanotechnology Condensed matter physics business.industry Crystal structure Mechanical Engineering General Chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics hexagonal manganites Ferroelectricity ferroelectric functional oxide dislocations Semiconductor Defects Light emission Deformation (engineering) Dislocation 0210 nano-technology business |
| Zdroj: | Nano Letters Nano Letters, 21 (8) |
| ISSN: | 1530-6992 1530-6984 |
| Popis: | Dislocations are 1D topological defects with emergent electronic properties. Their low dimensionality and unique properties make them excellent candidates for innovative device concepts, ranging from dislocation-based neuromorphic memory to light emission from diodes. To date, dislocations are created in materials during synthesis via strain fields or flash sintering or retrospectively via deformation, for example, (nano)-indentation, limiting the technological possibilities. In this work, we demonstrate the creation of dislocations in the ferroelectric semiconductor Er(Mn,Ti)O3 with nanoscale spatial precision using electric fields. By combining high-resolution imaging techniques and density functional theory calculations, direct images of the dislocations are collected, and their impact on the local electric transport behavior is studied. Our approach enables local property control via dislocations without the need for external macroscopic strain fields, expanding the application opportunities into the realm of electric-field-driven phenomena. Nano Letters, 21 (8) ISSN:1530-6984 ISSN:1530-6992 |
| Databáze: | OpenAIRE |
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