Shear Stress Measurements on InAs Nanowires by AFM Manipulation

Autor:	Michael Bordag, Aline Ribayrol, Håkan Pettersson, Gabriela Conache, Lars Samuelson, Linus Fröberg, S. M. Gray, Lars Montelius
Rok vydání:	2007
Předmět:	Electric Wiring Materials science Macromolecular Substances Surface Properties Molecular Conformation Nanowire Physics::Optics Nanotechnology Microscopy Atomic Force Curvature Indium Arsenicals Biomaterials Micromanipulation Condensed Matter::Materials Science chemistry.chemical_compound Materials Testing Nano Microscopy Shear stress General Materials Science Particle Size Elasticity (economics) Composite material Nanotubes Atomic force microscopy General Chemistry Elasticity chemistry Stress Mechanical Indium arsenide Crystallization Shear Strength Biotechnology
Zdroj:	Small. 3:1398-1401
ISSN:	1613-6829 1613-6810
Popis:	In this paper, we report on a novel approach to measure shear stress between elastic nanowires and a SiO2 surface. The method is based on the fact that the curvature of an elastically deformed nano ...
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9997f2217257a79ea061340dca343f76 https://doi.org/10.1002/smll.200700052 Zobrazit plný text záznamu Plný text