Low open fraction coded masks for x-ray backscatter imaging
| Autor: | Matthew J. F. Healy, David W. Lane, Ian Jupp, Anna Vella, David Lockley, André A. M. Muñoz |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2018 |
| Předmět: |
Physics
Random array Backscatter business.industry Optical engineering General Engineering X-ray Near and far field 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Atomic and Molecular Physics and Optics 010309 optics Set (abstract data type) x-ray backscatter Signal-to-noise ratio Optics 0103 physical sciences coded apertures Fraction (mathematics) 0210 nano-technology business coded masks low open fraction |
| Zdroj: | IndraStra Global. |
| ISSN: | 2381-3652 |
| Popis: | Previous research has indicated that coded masks with open fractions |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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