First assemblies using Deep Trench Termination diodes
| Autor: | Eric Woirgard, Jean-Yves Deletage, Stephane Azzopardi, L. Theolier, Francois Le Henaff, F. Baccar |
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| Přispěvatelé: | Fiabilité / Puissance, Laboratoire de l'intégration, du matériau au système (IMS), Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université Sciences et Technologies - Bordeaux 1-Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université Sciences et Technologies - Bordeaux 1, ANR 2011 BS09 033,ANR 2011 BS09 033 |
| Rok vydání: | 2014 |
| Předmět: |
010302 applied physics
Materials science Silicon business.industry [SPI.NRJ]Engineering Sciences [physics]/Electric power 020208 electrical & electronic engineering dBc Sintering chemistry.chemical_element Nanotechnology 02 engineering and technology Chip 01 natural sciences Reliability (semiconductor) chemistry 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Optoelectronics Breakdown voltage Electrical measurements business Diode |
| Zdroj: | The 26th International Symposium on Power Semiconductor Devices and ICs (ISPSD'14) The 26th International Symposium on Power Semiconductor Devices and ICs (ISPSD'14), Jun 2014, Waikoloa, United States. pp.143-146, ⟨10.1109/ISPSD.2014.6855996⟩ |
| Popis: | International audience; In this paper, diodes manufactured in 2008, allowing to obtain the first electrical measurements of the Deep Trench Termination (DT2), are analyzed in a reliability purpose. For the first time, assemblies are made using DT2 diodes reported on Direct Bonded Copper (DBC) substrates using silver sintering process in order to confirm the possibility to integrate this technology in future lead-free packaging. Indeed, geometric singularities and different mechanical properties of BenzoCycloButen (BCB) and silicon could weaken the chip. In order to confirm the device electrical stability, passive thermal ageing are achieved. Then, breakdown voltage measurements, optical observations and TCAD-SENTAURUS simulations are investigated in order to provide explanation of the induced phenomenon linked to the aging. |
| Databáze: | OpenAIRE |
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