Microphotoluminescence (μPL) measurements of bidimensional materials in a custom-made setup

Autor: Mauro Tonelli, Alessandro Tredicucci, F.V. Di Girolamo, Alberto Sottile, A. Di Lieto, Stefano Roddaro
Přispěvatelé: Di Girolamo, F. V., Di Lieto, A., Sottile, A., Roddaro, S., Tonelli, M., Tredicucci, A.
Rok vydání: 2019
Předmět:
Zdroj: Journal of physics. Conference series
1226 (2019). doi:10.1088/1742-6596/1226/1/012008
info:cnr-pdr/source/autori:Di Girolamo, F. V.; Di Lieto, A.; Sottile, A.; Roddaro, S.; Tonelli, M.; Tredicucci, A./titolo:Microphotoluminescence (?PL) measurements of bidimensional materials in a custom-made setup/doi:10.1088%2F1742-6596%2F1226%2F1%2F012008/rivista:Journal of physics. Conference series (Print)/anno:2019/pagina_da:/pagina_a:/intervallo_pagine:/volume:1226
ISSN: 1742-6596
1742-6588
DOI: 10.1088/1742-6596/1226/1/012008
Popis: The continuously growing interest in the so called bidimensional (2D) materials has been accompanied by a parallel development of techniques specifically devoted to manipulating and measuring micro-sized objects. Here a flexible microphotoluminescence (μPL) custom-made setup has been built on purpose: every setup component has been optimized for 2D materials; an automatized system able to perform measurements in different positions of the sample and execute mapping have been made; the dependence of the μPL intensity, peak center and other properties such as the Full Width Half Maximum (FWHM) on the position has been then extracted. The attention has been focused on WS 2 and phosphorene. Optical response has been compared between Chemical Vapor Deposition (CVD) grown WS 2 transferred on graphene and sapphire, especially focusing on the changes in the trion peak. Signatures have been found that can be attributed to photoluminescence from thick (more than five layers) phosphorene flakes.
Databáze: OpenAIRE