Devices for Thermal Conductivity Measurements of Electroplated Bi for X-ray TES Absorbers

Autor:	Orlando Quaranta, Lisa M. Gades, Cindy Xue, Ralu Divan, C. Suzanne Miller, Umeshkumar M. Patel, Tejas Guruswamy, Antonino Miceli
Rok vydání:	2022
Předmět:	Condensed Matter - Materials Science Physics - Instrumentation and Detectors Materials Science (cond-mat.mtrl-sci) FOS: Physical sciences General Materials Science Instrumentation and Detectors (physics.ins-det) Condensed Matter Physics Atomic and Molecular Physics and Optics
Zdroj:	Journal of Low Temperature Physics. 209:1165-1171
ISSN:	1573-7357 0022-2291
Popis:	Electroplated Bismuth (Bi) is commonly used in Transition-Edge Sensors (TESs) for X-rays because of its high stopping power and low heat capacity. Electroplated Bi is usually grown on top of another metal that acts as seed layer, typically gold (Au), making it challenging to extrapolate its thermoelectric properties. In this work, we present four-wire resistance measurement structures that allow us to measure resistance as a function of temperature of electroplated Bi independently of Au. The results show that the thermal conductivity of the Bi at 3 K is high enough to guarantee the correct thermalization of X-ray photons when used as an absorber for TESs. Comment: Proceedings of the 19th International Workshop on Low Temperature Detectors (LTD19)
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::983f9280272f113626a901dcd89db505 https://doi.org/10.1007/s10909-022-02876-9 Zobrazit plný text záznamu Plný text ve formátu PDF Plný text ve formátu HTML
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