X-ray polarimetry with an active-matrix pixel proportional counter
| Autor: | Steve Ready, R. A. Street, J. K. Black, P. Deines-Jones |
|---|---|
| Rok vydání: | 2003 |
| Předmět: |
Amorphous silicon
Nuclear and High Energy Physics Physics - Instrumentation and Detectors Physics::Instrumentation and Detectors Astrophysics::High Energy Astrophysical Phenomena Polarimetry FOS: Physical sciences Proportional counter X-ray telescope Astrophysics law.invention chemistry.chemical_compound Optics law Instrumentation Physics business.industry Astrophysics (astro-ph) Detector technology industry and agriculture Astrophysics::Instrumentation and Methods for Astrophysics Polarimeter Instrumentation and Detectors (physics.ins-det) equipment and supplies Polarization (waves) Active matrix chemistry business |
| Zdroj: | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 513:639-643 |
| ISSN: | 0168-9002 |
| Popis: | We report the first results from an X-ray polarimeter with a micropattern gas proportional counter using an amorphous silicon active matrix readout. With 100% polarized X-rays at 4.5 keV, we obtain a modulation factor of 0.33 +/- 0.03, confirming previous reports of the high polarization sensitivity of a finely segmented pixel proportional counter. The detector described here has a geometry suitable for the focal plane of an astronomical X-ray telescope. Amorphous silicon readout technology will enable additional extensions and improvements. Comment: 4 pages, 4 figures, 1 table |
| Databáze: | OpenAIRE |
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