Perfect X-ray focusing via fitting corrective glasses to aberrated optics

Autor: Martin Wünsche, Eric Galtier, Andreas Schropp, Tobias Ullsperger, Stylianos Giakoumidis, Ulrich Vogt, Felix Wittwer, Jan Garrevoet, Ulrich Wagner, Gerald Falkenberg, Bob Nagler, Christoph Rau, Ulrike Boesenberg, Hae Ja Lee, Karolis Parfeniukas, Stefan Nolte, Christian Rödel, Christian G. Schroer, Frank Seiboth, Jussi Rahomäki, Maria Scholz
Přispěvatelé: Publica
Jazyk: angličtina
Rok vydání: 2017
Předmět:
Zdroj: Nature Communications 8, 14623 (2017). doi:10.1038/ncomms14623
Nature Communications, Vol 8, Iss 1, Pp 1-5 (2017)
Nature Communications
Popis: Nature Communications 8, 14623(2017). doi:10.1038/ncomms14623
Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology. Both are limited by today’s technology. In this work, we present accurate at wavelength measurements of residual aberrations of a refractive X-ray lens using ptychography to manufacture a corrective phase plate. Together with the fitted phase plate the optics shows diffraction-limited performance, generating a nearly Gaussian beam profile with a Strehl ratio above 0.8. This scheme can be applied to any other focusing optics, thus solving the X-ray optical problem at synchrotron radiation sources and X-ray free-electron lasers.
Published by Nature Publishing Group, London
Databáze: OpenAIRE