Nanomechanical mapping in air or vacuum using multi-harmonic signals in tapping mode atomic force microscopy
| Autor: | Arvind Raman, Ronald G. Reifenberger, Nurul Huda Shaik |
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| Rok vydání: | 2020 |
| Předmět: |
Materials science
Mechanical Engineering Acoustics Phase (waves) Bioengineering 02 engineering and technology General Chemistry 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences Vibration Nonlinear system Amplitude Signal-to-noise ratio Mechanics of Materials Indentation Harmonic General Materials Science Electrical and Electronic Engineering 0210 nano-technology Elastic modulus |
| Zdroj: | Nanotechnology. 31:455502 |
| ISSN: | 1361-6528 0957-4484 |
| DOI: | 10.1088/1361-6528/ab9390 |
| Popis: | We present a method by which multi-harmonic signals acquired during a normal tapping mode (amplitude modulated) AFM scan of a sample in air or vacuum with standard microcantilevers can be used to map quantitatively the local mechanical properties of the sample such as elastic modulus, adhesion, and indentation. The approach is based on the observation that during the tapping mode operation in air or vacuum, the 0th and 2nd harmonic signals of microcantilever vibration are encountered under most operating conditions and can be mapped with sufficient signal to noise ratio. By measuring the amplitude and phase of the driven harmonic as well as the 0th and 2nd harmonic observables, we find analytical/semi-analytical formulas that relate these multi-harmonic observables to local mechanical properties for several classical tip-sample interaction models. Least squares estimation of the local mechanical properties is performed pixel by pixel. The method is validated through computations as well as experimental data acquired on a polymer blend made of Polystyrene and Polyolefin elastomer. |
| Databáze: | OpenAIRE |
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