Quantitative Analysis of TM Lateral Leakage in Foundry Fabricated Silicon Rib Waveguides
| Autor: | Arnan Mitchell, Thach G. Nguyen, Wim Bogaerts, Anthony P. Hope |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Technology and Engineering
Materials science Silicon chemistry.chemical_element Silicon on insulator COUPLERS 02 engineering and technology Radiation optical waveguides 01 natural sciences 010309 optics Length measurement 020210 optoelectronics & photonics Optics 0103 physical sciences 0202 electrical engineering electronic engineering information engineering MODE Electrical and Electronic Engineering Silicon-on-insulator Electronic circuit Leakage (electronics) Quantum optics Silicon photonics business.industry Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials chemistry integrated circuit technology Optoelectronics business CIRCUITS |
| Zdroj: | IEEE PHOTONICS TECHNOLOGY LETTERS |
| ISSN: | 1941-0174 1041-1135 |
| DOI: | 10.1109/lpt.2015.2500233 |
| Popis: | We show that thin, shallow ridge, silicon-on-insulator waveguides exhibiting a lateral leakage behavior can be designed and fabricated using a standard silicon photonic foundry platform. We analyze the propagation loss through the observation of the transmitted TM polarized guided mode and TE polarized radiation and experimentally demonstrate that propagation losses as low as 0.087 dB/mm can be achieved. This demonstration will open a new frontier for practical devices exploiting a lateral leakage behavior with potential applications in the fields of biosensing and quantum optics among others. |
| Databáze: | OpenAIRE |
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