Surface Phonon Polariton Resonance Imaging Using Long-Wave Infrared-Visible Sum-Frequency Generation Microscopy
| Autor: | Alexander Paarmann, Martin Wolf, Joshua D. Caldwell, Alexander J. Giles, Wieland Schöllkopf, Riko Kiessling, Sandy Gewinner, Yujin Tong |
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| Jazyk: | angličtina |
| Předmět: |
Materials science
Infrared Nanophotonics FOS: Physical sciences Physics::Optics Astrophysics::Cosmology and Extragalactic Astrophysics 02 engineering and technology 01 natural sciences 010309 optics 0103 physical sciences Microscopy Polariton Electrical and Electronic Engineering Astrophysics::Galaxy Astrophysics Condensed Matter - Materials Science Sum-frequency generation business.industry Materials Science (cond-mat.mtrl-sci) Resonance Surface phonon 021001 nanoscience & nanotechnology Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Semiconductor Optoelectronics Astrophysics::Earth and Planetary Astrophysics 0210 nano-technology business Optics (physics.optics) Physics - Optics Biotechnology |
| Zdroj: | ACS Photonics |
| ISSN: | 2330-4022 |
| DOI: | 10.1021/acsphotonics.9b01335 |
| Popis: | We experimentally demonstrate long-wave infrared-visible sum-frequencygeneration microscopy for imaging polaritonic resonances of infrared (IR)nanophotonic structures. This nonlinear-optical approach provides direct accessto the resonant field enhancement of the polaritonic near fields, while thespatial resolution is limited by the wavelength of the visible sum-frequencysignal. As a proof-of-concept, we here study periodic arrays ofsubdiffractional nanostructures made of 4H-silicon carbide supporting localizedsurface phonon polaritons. By spatially scanning tightly focused incidentbeams, we observe excellent sensitivity of the sum-frequency signal to theresonant polaritonic field enhancement, with a much improved spatial resolutiondetermined by visible laser focal size. However, we report that the tightfocusing can also induce sample damage, ultimately limiting the achievableresolution with the scanning probe method. As a perspective approach towardsovercoming this limitation, we discuss the concept of using wide-fieldsum-frequency generation microscopy as a universal experimental tool that wouldoffer long-wave IR super-resolution microscopy with spatial resolution farbelow the IR diffraction limit. |
| Databáze: | OpenAIRE |
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