A Fuzzy Control of Peltier-Based Thermal Chamber for Reliability Tests

Autor:	Toncho Papanchev
Rok vydání:	2020
Předmět:	reliability tests Peltier elements Reliability (semiconductor) Computer science Thermoelectric effect Thermal fuzzy logic thermal chamber Fuzzy control system Temperature cycling Fuzzy logic Automotive engineering
Zdroj:	2020 21st International Symposium on Electrical Apparatus & Technologies (SIELA).
DOI:	10.1109/siela49118.2020.9167106
Popis:	This article studies possibilities of applying some artificial intellect techniques to control the thermal cycling modes of a thermal chamber for reliability tests. Peltier elements are used to be achieved consecutive heating/cooling cycles. A fuzzy logic approach is applied to control the temperature inside the chamber according to previous given requirements.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::972bf8cbdb24e8bd106bb50b26e3bccf https://doi.org/10.1109/siela49118.2020.9167106 Zobrazit plný text záznamu