Microstructure and properties of highly oriented PZT thin films on epitaxial ceramic electrodes prepared by CSD
Autor: | Rainer Waser, U. Hasenkox |
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Rok vydání: | 1999 |
Předmět: | |
Zdroj: | ResearcherID |
ISSN: | 1563-5112 0015-0193 |
Popis: | Epitaxial thin films of Lag0.7Sr0.3MnO3 and Lag0.5Sr0.5CoO3 were deposited by chemical solution deposition on single-crystal LaAlO3. These single-crystal layers served as bottom electrodes for the growth of ferroelectric PZT thin films. By XRD analysis, influences of processing on crystallographic properties were found. The thin film properties were influenced by the thickness of the crystallizing amorphous layer and also by the heating rate. Hysteresis measurements were performed on selected samples, showing a dependence of the remanent polarization on the crystallographic properties. |
Databáze: | OpenAIRE |
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