In-situ Scanning Transmission X-Ray Microscopy of Catalytic Solids and Related Nanomaterials
Autor: | de Groot, Frank M. F., de Smit, Emiel, van Schooneveld, Matti M., Aramburo Corrales, Luis, Weckhuysen, Bert M., Sub Inorganic Chemistry and Catalysis, Inorganic Chemistry and Catalysis |
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Přispěvatelé: | Sub Inorganic Chemistry and Catalysis, Inorganic Chemistry and Catalysis |
Jazyk: | angličtina |
Rok vydání: | 2010 |
Předmět: |
Chemical imaging
CHEMICAL CONTRAST Absorption spectroscopy Analytical chemistry Nanotechnology ADVANCED LIGHT-SOURCE Scanning transmission X-ray microscopy Nanomaterials ABSORPTION-SPECTROSCOPY Fischer-Tropsch catalysts Scanning transmission electron microscopy Microscopy Taverne Physical and Theoretical Chemistry Spectroscopy nanomaterials ELECTRON-MICROSCOPY X-ray absorption spectroscopy electron microscopy Chemistry BESSY-II Atomic and Molecular Physics and Optics OVER-EXCHANGED FE/ZSM5 RADIATION-DAMAGE in-situ scanning transmission X-ray microscopy (STXM) EDGE SPECTROMICROSCOPY ATOMIC-SCALE |
Zdroj: | ChemPhysChem, 11(5), 951. Wiley-VCH Verlag |
ISSN: | 1439-4235 |
Popis: | The present status of in-situ scanning transmission X-ray microscopy (STXM) is reviewed, with an emphasis on the abilities of the STXM technique in comparison with electron microscopy. The experimental aspects and interpretation of X-ray absorption spectroscopy (XAS) are briefly introduced and the experimental boundary conditions that determine the potential applications for in-situ XAS and in-situ STXM studies are discussed. Nanoscale chemical imaging of catalysts under working conditions is outlined using cobalt and iron Fischer-Tropsch catalysts as showcases. In the discussion, we critically compare STXM-XAS and STEM-EELS (scanning transmission electron microscopy-electron energy loss spectroscopy) measurements and indicate some future directions of in-situ nanoscale imaging of catalytic solids and related nanomaterials. |
Databáze: | OpenAIRE |
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