Mechanically scanned interference pattern structured illumination imaging
| Autor: | Jarom Jackson, Dallin Durfee |
|---|---|
| Rok vydání: | 2019 |
| Předmět: |
Synthetic aperture radar
Physics business.industry Physics::Optics Curved mirror 02 engineering and technology 021001 nanoscience & nanotechnology Interference (wave propagation) 01 natural sciences Atomic and Molecular Physics and Optics law.invention Numerical aperture 010309 optics Lens (optics) Wavelength Optics law Light sheet fluorescence microscopy 0103 physical sciences Microscopy 0210 nano-technology business |
| Zdroj: | Optics express. 27(10) |
| ISSN: | 1094-4087 |
| Popis: | We present a fully lensless single pixel imaging technique using mechanically scanned interference patterns. The method uses only simple, flat optics; no lenses, curved mirrors, or acousto-optics are used in pattern formation or detection. The resolution is limited by the numerical aperture of the angular access to the object, with a fundamental limit of a quarter wavelength and no fundamental limit on working distance. While it is slower than some similar techniques, the lack of a lens objective and simplification of the required optics could make it more applicable in difficult wavelength regimes such as UV or X-ray. |
| Databáze: | OpenAIRE |
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