Electrical characterization of a quartz crystal in high pressure CO2 by impedance analysis
| Autor: | Jérôme Pauly, Jean-Luc Daridon, Marc Cassiède, Jean-Hugues Paillol |
|---|---|
| Přispěvatelé: | Thermodynamique et Energétique des fluides complexes (TEFC), Université de Pau et des Pays de l'Adour (UPPA)-TOTAL SA-Centre National de la Recherche Scientifique (CNRS), LGE, Hélioparc, Laboratoire des Fluides Complexes et leurs Réservoirs (LFCR), TOTAL FINA ELF-Université de Pau et des Pays de l'Adour (UPPA)-Centre National de la Recherche Scientifique (CNRS), Laboratoire des Sciences de l'Ingénieur Appliquées à la Mécanique et au génie Electrique (SIAME), Université de Pau et des Pays de l'Adour (UPPA) |
| Jazyk: | angličtina |
| Rok vydání: | 2010 |
| Předmět: |
inorganic chemicals
Materials science Analytical chemistry 02 engineering and technology complex mixtures 01 natural sciences Crystal Viscosity loading Adsorption Quartz crystal microbalance 0103 physical sciences Sauerbrey equation Thin film 010306 general physics Dissolution Quartz ComputingMilieux_MISCELLANEOUS Mass loading Impedance analysis technology industry and agriculture Resonance respiratory system 021001 nanoscience & nanotechnology Condensed Matter Physics respiratory tract diseases High-pressure CO2 Slippage effect Solubility [PHYS.PHYS.PHYS-CHEM-PH]Physics [physics]/Physics [physics]/Chemical Physics [physics.chem-ph] 0210 nano-technology |
| Zdroj: | High Pressure Research High Pressure Research, Taylor & Francis, 2010, 30 (1), pp.72-77. ⟨10.1080/08957950903527267⟩ Electrical characterization of a quartz crystal in high pressure CO2 by impedance analysis XLVIIth meeting of the European High Pressure Research Group XLVIIth meeting of the European High Pressure Research Group, Sep 2009, Paris, France |
| ISSN: | 0895-7959 1477-2299 |
| DOI: | 10.1080/08957950903527267⟩ |
| Popis: | International audience; The quartz crystal microbalance (QCM) is a very accurate sensor for measuring small changes of mass of thin films spread on the quartz surface. Under certain conditions, the resonance frequency of a quartz crystal can be used for monitoring the mass change caused by solvent adsorption or dissolution inside a film. However, when a quartz crystal is immersed in a high-pressure non-inert gas, various effects such as pressure, viscosity, roughness on the surface of the quartz crystal, adsorption of gas or even gas film formation slipping at the solid-gas interface can influence the resonance frequency of the quartz crystal and consequently complicate the relation between mass and frequency changes. In order to determine experimentally such effects in contact with carbon dioxide in the neighborhood of the critical conditions, the resonance curve of a quartz crystal under gas pressure was examined with a network analyzer which is able to determine both resonance frequency and half-band-half-width on several overtones. |
| Databáze: | OpenAIRE |
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