Autor: |
George Pelekanos, Koung Hee Leem, Juliano B. Francisco, Fermín S. V. Bazán |
Rok vydání: |
2012 |
Předmět: |
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Zdroj: |
Journal of Computational and Applied Mathematics. 236(17):4264-4275 |
ISSN: |
0377-0427 |
DOI: |
10.1016/j.cam.2012.05.008 |
Popis: |
Kirsch’s factorization method is a fast inversion technique for visualizing the profile of a scatterer from measurements of the far-field pattern. We present a Tikhonov parameter choice approach based on a maximum product criterion (MPC) which provides a regularization parameter located in the concave part of the L-curve on a log–log scale. The performance of the method is evaluated by comparing our reconstructions with those obtained via the L-curve, Morozov’s discrepancy principle and the SVD-tail. Numerical results that illustrate the effectiveness of the MPC in reconstruction problems involving both simulated and real data are reported and analyzed. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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