An Extension of Stray Voltage Capture for Hard Switching Fault Detection in Power Electronics with Half-Bridge Structure

Autor: Henk Huisman, Darian Verdy Retianza, Jeroen van Duivenbode
Přispěvatelé: Electromechanics and Power Electronics, Power Electronics Lab, EIRES System Integration
Jazyk: angličtina
Rok vydání: 2020
Předmět:
Zdroj: 23rd International Conference on Electrical Machines and Systems, ICEMS 2020, 1002-1007
STARTPAGE=1002;ENDPAGE=1007;TITLE=23rd International Conference on Electrical Machines and Systems, ICEMS 2020
Popis: A short circuit detection based on a Stray Voltage Capture (SVC) cannot robustly detect a Hard Switching Fault (HSF) if an additional stray inductance is present in the short circuit path. Therefore, this paper proposes an extension of the Stray Voltage Capture (ESVC) method to detect a HSF based on the integration of the SVC output. The result shows that a HSF is detected in the MOSFET linear region and can be easily implemented in any converter with a Half-Bridge structure.
Databáze: OpenAIRE