Determination of Young’s Modulus of Wurtzite III–V Nanowires by the Methods of Scanning Probe Microscopy
| Autor: | Harri Lipsanen, Tuomas Haggren, Mikhail S. Dunaevskiy, Prokhor A. Alekseev, Pavel Geydt, Erkki Lähderanta |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2019 |
| Předmět: |
Materials science
ta221 Nanowire Modulus scanning probe microscopy wurtzite crystal structure Young's modulus 02 engineering and technology 01 natural sciences 010309 optics symbols.namesake Scanning probe microscopy Deflection (engineering) 0103 physical sciences Young’s modulus Composite material Thin film ta216 Wurtzite crystal structure semiconductor nanowires ta114 Conical surface 021001 nanoscience & nanotechnology Surfaces Coatings and Films symbols 0210 nano-technology |
| Zdroj: | Journal of Surface Investigation: X-Ray, Synchrotron and Neutron Techniques. 13(1):53-55 |
| ISSN: | 1027-4510 |
| Popis: | —A scanning probe microscopy method that allows one to measure Young’s modulus of thin and flexible nanowires is developed, which consists in measuring the deflection profiles under conditions of precise force control. This method can be applied to any thin and flexible one-dimensional or two-dimensional object. Using this approach, Young’s moduli of thin InP conical nanowires with the wurtzite and zincblende structures are measured. It is found that nanowires with the pure wurtzite structure have a higher value of Young’s modulus than the nanowires containing alternating wurtzite–zincblende phases. |
| Databáze: | OpenAIRE |
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