| Autor: |
A. Almeida, Luc Van Hoorebeke, Yoni De Witte, Matthieu Boone, Manuel Dierick |
| Rok vydání: |
2012 |
| Předmět: |
|
| Zdroj: |
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 18(2) |
| ISSN: |
1435-8115 |
| Popis: |
In conventional X-ray microtomography (μCT), the three-dimensional (3D) distribution of the attenuation coefficient of X-rays is measured and reconstructed in a 3D volume. As spatial resolution increases, the refraction of X-rays becomes a significant phenomenon in the imaging process. Although this so-called phase contrast was initially a cumbersome feature in lab-based μCT, special phase retrieval algorithms were developed to exploit these effects. Clear advantages in terms of visualization and analysis can be seen when phase retrieval algorithms are applied, including an increased signal-to-noise ratio. In this work, this is demonstrated both on simulated and measured data. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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