Investigation of coupled cobalt–silver nanoparticle system by plan view TEM
| Autor: | Hongzhou Zhang, Sunil K. Arora, B. J. O'Dowd, Colm C. Faulkner, Igor V. Shvets, Daniel Fox, Ruggero Verre |
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| Rok vydání: | 2012 |
| Předmět: |
Materials science
Microscope Nanoparticle chemistry.chemical_element Nanotechnology Lift-out Ag 02 engineering and technology 01 natural sciences Focused ion beam Silver nanoparticle law.invention Co law 0103 physical sciences General Materials Science Sample preparation Spectroscopy General 010302 applied physics 021001 nanoscience & nanotechnology chemistry Transmission electron microscopy 0210 nano-technology Cobalt |
| Zdroj: | Progress in Natural Science: Materials International. 22(3):186-192 |
| ISSN: | 1002-0071 |
| DOI: | 10.1016/j.pnsc.2012.04.001 |
| Popis: | We present a transmission electron microscopy (TEM) investigation of a coupled cobalt and silver nanoparticle system. A plan view in situ lift-out method for preparing samples for TEM using the focused ion beam (FIB) microscope was used. This technique is used to prepare high quality TEM samples with site specificity in a short time and with a high success rate. We demonstrate the ability of the plan view sample preparation technique to provide information about an ordered system of nanoparticles which could not be observed using standard FIB cross sectioning of the sample. High resolution TEM and energy dispersive X-ray spectroscopy mapping of both cross sectional and plan view samples are presented, clearly showing the significant benefit of plan view TEM analysis for certain samples. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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