Scanning hard x-ray differential phase contrast imaging with a double wedge absorber
| Autor: | Taihei Mukaide, Takashi Noma, Masatoshi Watanabe, Atsuo Iida, Kazuhiro Takada |
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| Rok vydání: | 2009 |
| Předmět: |
Physics
business.product_category business.industry Phase (waves) Reproducibility of Results Field of view Equipment Design Microbeam Sensitivity and Specificity Refraction Displacement (vector) Wedge (mechanical device) Equipment Failure Analysis Radiographic Image Enhancement Radiography Refractometry Optics Double wedge Computer-Aided Design business Instrumentation Beam (structure) |
| Zdroj: | Review of Scientific Instruments. 80:033707 |
| ISSN: | 1089-7623 0034-6748 |
| Popis: | Two-directional differential phase contrast images were measured using an x-ray microbeam and a double wedge absorber. The wedge absorber converts the displacement of an x-ray beam that is refracted by an object into change of x-ray intensity. The double wedge absorber made it possible to detect values of two-directional refraction angle with microrad sensitivity simultaneously. By Fourier integration of two-directional phase gradients calculated from the refraction angle instead of line integration of one-directional phase gradients, we obtained a quantitative phase map without artifacts even when only a part of the boundaries of the object were in the field of view. One of the characteristics of this technique is flexibility in a sensitivity of the phase gradient. By changing of shape or material of the wedge absorber, it is comparatively easy to control the detection limit of the refraction angle. |
| Databáze: | OpenAIRE |
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