Evolution of the Internal Structure of Short-Period Cr/V Multilayers with Different Vanadium Layers Thicknesses

Autor: Zhong Zhang, Zhanshan Wang, Runze Qi, Igor V. Kozhevnikov, Jiani Fei, Pin Li, Qiushi Huang, Yang Liu
Jazyk: angličtina
Rok vydání: 2019
Předmět:
Zdroj: Materials, Vol 12, Iss 18, p 2936 (2019)
Materials
Volume 12
Issue 18
ISSN: 1996-1944
Popis: Cr/V multilayer mirrors are suitable for applications in the &ldquo
water window&rdquo
spectral ranges. To study factors influencing the internal microstructure of Cr/V multilayers, multilayers with different vanadium layers thicknesses varying from 0.6 nm to 4.0 nm, and a fixed thickness (1.3 nm) of chromium layers, were fabricated and characterized with a set of experimental techniques. The average interface width characterizing a cumulative effect of different structure irregularities was demonstrated to exhibit non-monotonous dependence on the V layer thickness and achieve a minimal value of 0.31 nm when the thickness of the V layers was 1.2 nm. The discontinuous growth of very thin V films increased in roughness as the thickness of V layers decreased. The columnar growth of the polycrystalline grains in both materials became more pronounced with increasing thickness, resulting in a continuous increase in the interface width to a maximum of 0.9 nm for a 4 nm thickness of the V layer.
Databáze: OpenAIRE
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