Measuring the topological charge and ellipticity of elliptic vortex
| Autor: | Pan Xinjian, Chongfu Zhang, Li Zhili, Qing Wang, Deng Chunjian |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2022 |
| Předmět: |
Physics
Diffraction Range (particle radiation) Condensed matter physics Rectangular aperture Aperture Diffraction patterns General Engineering Phase (waves) Engineering (General). Civil engineering (General) Vortex Topological charge measurement Elliptic optical vortices Gradient force TA1-2040 Topological quantum number Sign (mathematics) |
| Zdroj: | Alexandria Engineering Journal, Vol 61, Iss 6, Pp 4323-4330 (2022) |
| ISSN: | 1110-0168 |
| Popis: | The intensities and phase profiles of the elliptic optics vortex beam both are determined by the topological charge (TC) and ellipticity. This paper presents an efficient and simple method for measuring the TC and ellipticity of elliptic vortex. By observing the diffraction patterns, the TC modulus and ellipticity can be probed with the suitable rectangular aperture, and the TC sign can be detected with the suitable right triangular aperture. The scheme works well even for high-order elliptic vortex with topological charge value as high as ± 18, and ellipticity range from 0.5 to 2 at least. Obviously, the measurement of TC and ellipticity have important research value for promoting the application of elliptical vortex. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|