Direct measurement of the x-ray refractive index by Fresnel diffraction at a transparent edge

Autor:	C. W. Gayer, G. Pretzler, C. Stelzmann, D. Hemmers
Rok vydání:	2013
Předmět:	Diffraction Materials science business.industry Resolution (electron density) X-ray optics Atomic and Molecular Physics and Optics Ptychography Particle detector Wavelength Optics Optoelectronics business Refractive index Fresnel diffraction
Zdroj:	Optics Letters. 38:1563
ISSN:	1539-4794 0146-9592
DOI:	10.1364/ol.38.001563
Popis:	We demonstrate the feasibility of measuring x-ray refractive indices by transparent edge diffraction without recourse to the Kramers-Kronig relations. The method requires a coherent x-ray source, a transparent sample with a straight edge, and a high resolution x-ray detector. Here, we use the aluminum Kα radiation originating from a laser-produced plasma to coherently illuminate the edge of thin aluminum and beryllium foils. The resulting diffraction patterns are recorded with an x-ray CCD camera. From least-squares fits of Fresnel diffraction modeling to the measured data we determine the refractive index of Al and Be at the wavelength of the Al Kα radiation (0.834 nm, 1.49 keV).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::907af3161fec0f2097445024d6cb4a8d https://doi.org/10.1364/ol.38.001563 Zobrazit plný text záznamu