Optically trapped probes with nanometer-scale tips for femto-Newton force measurement
| Autor: | Boris N. Chichkov, Robert Stevens, R.N.J. Halsall, E. Freeman, Stanley W. Botchway, Renato Turchetta, Andrew D. Ward, D. W. K. Jenkins, I. M. Loader, Mark R. Pollard, Aleksandr Ovsianikov, Michael Towrie, Anthony W. Parker |
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| Rok vydání: | 2010 |
| Předmět: |
Scale (ratio)
Femto General Physics and Astronomy Trapping law.invention Nano-meter-scale Two photon polymerization Optics law medicine ddc:530 Transparent objects Optical trap Laser radiation field Physics Sensitive components business.industry Electron beams Stiffness Biological cells Laser Polymerization Probes Nanometre Dewey Decimal Classification::500 | Naturwissenschaften::530 | Physik medicine.symptom business Electron-beam lithography |
| Zdroj: | New Journal of Physics 12 (2010) |
| ISSN: | 1367-2630 |
| Popis: | We describe the development of a novel force probe, controlled by multiple optical traps, with a nanometer-scale tip that protrudes outside the direct laser radiation field. We have measured forces to an accuracy of 240 fN, which enables future experiments that probe photo-sensitive components (such as biological cells) and non-transparent objects. The probes were produced using two methods, electron beam lithography and two-photon polymerization, with the latter providing approximately twice as much trapping stiffness. |
| Databáze: | OpenAIRE |
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