Mueller matrix for characterization of one-dimensional rough perfectly reflecting surfaces in a conical configuration
| Autor: | LuXin Zou, S. E. Acosta-Ortiz, R. E. Luna |
|---|---|
| Rok vydání: | 2007 |
| Předmět: |
Physics
Plane of incidence business.industry High Energy Physics::Phenomenology Astrophysics::Instrumentation and Methods for Astrophysics Polarimetry Physics::Optics Conical surface Mathematics::Spectral Theory Polarization (waves) Atomic and Molecular Physics and Optics Optics Conic section Mueller calculus business Complex amplitude |
| Zdroj: | Optics letters. 23(14) |
| ISSN: | 0146-9592 |
| Popis: | Theoretical results of the use of a Mueller matrix to characterize a one-dimensional rough perfectly reflecting, single-scattering surface in a conical configuration are presented. The conical Mueller matrix (CMM) is derived from the known Mueller matrix of this kind of surface in the plane of incidence [the plane Mueller matrix (PMM)]. The key argument is that, as the PMM is considered to be a Mueller–Jones matrix, an appropriate rotation of the complex amplitude matrix provides the conic Mueller matrix. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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