Properties of ternary photonic crystal consisting of dielectric/plasma/dielectric as a lattice period
| Autor: | Dhasarathan Vigneswaran, Wael A. Tabaza, K. S. Joseph Wilson, Mazen M. Abadla, Noor A. Tabaza, Sofyan A. Taya, N.R. Ramanujam |
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| Rok vydání: | 2019 |
| Předmět: |
Materials science
Physics::Optics Reflectance 02 engineering and technology Dielectric 01 natural sciences 010309 optics Photonic crystals Physics::Plasma Physics Lattice (order) 0103 physical sciences Transmittance Electrical and Electronic Engineering Photonic crystal business.industry Plasma 021001 nanoscience & nanotechnology Transfer matrix Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Optoelectronics Oblique incidence 0210 nano-technology business Ternary operation Refractive index |
| Zdroj: | Optik. 185:784-793 |
| ISSN: | 0030-4026 |
| DOI: | 10.1016/j.ijleo.2019.04.027 |
| Popis: | "Ternary photonic crystals have shown a superior performance over the binary ones. In this work, a ternary photonic crystal which has the structure dielectric/plasma/ dielectric is considered. Transmission through the proposed photonic crystal at oblique incidence on a specific PC structure is analyzed using the transfer matrix technique. The effect of the plasma layer of the photonic band gap is investigated. The use of the proposed photonic crystal as an optical sensor for detection of small changes within the plasma electron density or the index of refraction of the dielectric layers is investigated." "Ternary photonic crystals have shown a superior performance over the binary ones. In this work, a ternary photonic crystal which has the structure dielectric/plasma/ dielectric is considered. Transmission through the proposed photonic crystal at oblique incidence on a specific PC structure is analyzed using the transfer matrix technique. The effect of the plasma layer of the photonic band gap is investigated. The use of the proposed photonic crystal as an optical sensor for detection of small changes within the plasma electron density or the index of refraction of the dielectric layers is investigated." |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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