Surface extended electron loss fine structure: dependence on incident electron energy and collection solid angle

Autor: Theodore L. Einstein, Y. U. Idzerda, Ellen D. Williams, Robert L. Park
Rok vydání: 1985
Předmět:
Zdroj: Surface Science. 160:75-86
ISSN: 0039-6028
DOI: 10.1016/0039-6028(85)91028-3
Popis: Reflected electron energy loss fine structure above the M2,3 core excitation edge of Cu is measured using two dissimilar electron detection systems, a cylindrical mirror analyzer and an hemispherical grid detector, at primary energies ranging from 700 to 2000 eV. We find slight differences in the loss structures measured by the two detector systems, but the radial and pseudo-radial distribution functions calculated by an EXAFS type analysis of the extended fine structure show agreement in the first peak position to within ±0.02 A for all primary energies above 800 eV. Core-loss and fine-structure signals from sub-monolayers of C and O were observed. No fine structure was measurable for core-loss signals of single monolayer coverages of Na, K, Cs, or S.
Databáze: OpenAIRE