Copper–rubber interface delamination in stretchable electronics
| Autor: | Jan Neggers, van der O Olaf Sluis, Jpm Johan Hoefnagels, Mgd Marc Geers, Phm Peter Timmermans |
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| Přispěvatelé: | Department of Mechanical Engineering [Eindhoven], Eindhoven University of Technology [Eindhoven] (TU/e)-Technische Universiteit Eindhoven (TU/e), Laboratoire de Mécanique et Technologie (LMT), École normale supérieure - Cachan (ENS Cachan)-Centre National de la Recherche Scientifique (CNRS), Philips Research Laboratories [Eindhoven], Mechanics of Materials, Mechanical Engineering, Group Geers, Group Hoefnagels |
| Rok vydání: | 2010 |
| Předmět: |
Materials science
Scanning electron microscope Interface (computing) Stretchable electronics chemistry.chemical_element 02 engineering and technology 01 natural sciences [SPI]Engineering Sciences [physics] Natural rubber 0103 physical sciences General Materials Science Composite material Early failure 010302 applied physics Mechanical Engineering Delamination Metals and Alloys 021001 nanoscience & nanotechnology Condensed Matter Physics Copper chemistry Mechanics of Materials visual_art visual_art.visual_art_medium Elongation 0210 nano-technology |
| Zdroj: | Scripta Materialia Scripta Materialia, Elsevier, 2010, 63 (8), pp.875--878. ⟨10.1016/j.scriptamat.2010.06.041⟩ Scripta Materialia, 63(8), 875-878. Elsevier |
| ISSN: | 1359-6462 |
| DOI: | 10.1016/j.scriptamat.2010.06.041 |
| Popis: | International audience; Interface delamination in metal–rubber-type stretchable electronic systems leads to early failure. This paper reports an investigation of metal–rubber interfaces through in situ scanning electron microscopy imaging of the progressing delamination front of 90° peel tests of rubber on copper samples. The results show that the energy dissipated in the forming, elongation and rupture of ∼50 μm long fibrils constitutes the major part of the work of separation. The experiments are characterized and modeled using a cohesive zone-enriched finite-element model. |
| Databáze: | OpenAIRE |
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