A Procedure for the Improvement in the Determination of a TXRF Spectrometer Sensitivity Curve

Autor:	Leonardo Bennun, Vilma Sanhueza
Rok vydání:	2010
Předmět:	Spectrometer business.industry Chemistry Analytical chemistry Sensitivity (control systems) Process engineering business Analytical Chemistry
Zdroj:	Analytical Sciences. 26:331-335
ISSN:	1348-2246 0910-6340
Popis:	A simple procedure is proposed to determine the total reflection X-ray fluorescence (TXRF) spectrometer sensitivity curve; this procedure provides better accuracy and exactitude than the standard established method. It uses individual pure substances instead of the use of vendor-certified values of reference calibration standards, which are expensive and lack any method to check their quality. This method avoids problems like uncertainties in the determination of the sensitivity curve according to different standards. It also avoids the need for validation studies between different techniques, in order to assure the quality of their TXRF results.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8c8e29258125af3ff7eabb5ea1e5011d https://doi.org/10.2116/analsci.26.331 Zobrazit plný text záznamu Full text from SpringerLink