Using FIB-SEM as a Platform for the Positioning and Correlated Characterization of III-V Nanowires

Autor:	Bjørn-Ove Fimland, Dingding Ren, Vidar Tonaas Fauske, Aleksander B. Mosberg, Antonius T. J. van Helvoort
Jazyk:	angličtina
Rok vydání:	2018
Předmět:	010302 applied physics Materials science 0103 physical sciences Nanowire Nanotechnology 02 engineering and technology 021001 nanoscience & nanotechnology 0210 nano-technology 01 natural sciences Instrumentation Characterization (materials science)
Zdroj:	Microscopy and Microanalysis
Popis:	© 2018. This is the authors’ accepted and refereed manuscript to the article. Locked until 1.2.2019 due to copyright restrictions.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8c6d77ed92e979b168c9c6e4e6657c07 https://hdl.handle.net/11250/2557639 Zobrazit plný text záznamu