Metrological characterization of 3D imaging systems: progress report on standards developments
Autor: | Beraldin, J.-Angelo, Mackinnon, David, Cournoyer, Luc, National Research Council of Canada |
---|---|
Rok vydání: | 2015 |
Předmět: |
business.industry
Computer science media_common.quotation_subject Context (language use) Nanotechnology Investment (macroeconomics) Characterization (materials science) Metrology Software Characterization methods Risk analysis (engineering) Quality (business) business Production pipeline media_common |
Zdroj: | 17th International Congress of Metrology. |
DOI: | 10.1051/metrology/20150013003 |
Popis: | A significant issue for companies or organizations integrating non-contact three-dimensional (3D) imaging systems into their production pipeline is deciding in which technology to invest. Quality non-contact 3D imaging systems typically involve a significant investment when considering the cost of equipment, training, software, and maintenance contracts over the functional lifetime of a given system or systems notwithstanding the requirements of the global nature of manufacturing activities. Numerous methods have been published to “help” users navigate the many products and specifications claims about “quality”. Moreover, the “best” system for one application may not be ideally suited for another application. The lack of publically-available characterization methods from trusted sources for certain areas of 3D imaging make it difficult for a typical user to select a system based on information written on a specification sheet alone. An internationally-recognized standard is a vehicle that allows better communication between users and manufacturers. It is in this context that we present a progress report on standards developments to date in the diverse, but finite, world of non-contact 3D imaging systems from the nanometre to the 100 m range. 17 International Congress of Metrology, September 21-24, 2015, Paris, France |
Databáze: | OpenAIRE |
Externí odkaz: |