Quantitative-phase-contrast imaging of a two-level surface described as a 2D linear filtering process
| Autor: | Jiří Komrska, Radim Chmelík, Luděk Lovicar |
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| Předmět: |
Point spread function
Silicon Light Surface Properties Discrete-time Fourier transform Fast Fourier transform Holography Microscopy Atomic Force Transfer function symbols.namesake Imaging Three-Dimensional Optics Image Processing Computer-Assisted Microscopy Phase-Contrast Physics Models Statistical Fourier Analysis business.industry Short-time Fourier transform Phase-contrast imaging Equipment Design Atomic and Molecular Physics and Optics Interferometry Fourier transform Phase correlation Microscopy Electron Scanning symbols Crystallization business |
| Zdroj: | ResearcherID |
| Popis: | The paper deals with quantitative phase imaging of two-height-level surface reliefs. The imaging is considered to be a linear system and, consequently, the Fourier transform of the image is the product of the Fourier transform of a 2D function characterizing the surface and a specific 2D coherent transfer function. The Fourier transform of functions specifying periodic surface reliefs is factorized into two functions similar to lattice and structure amplitudes in crystal structure analysis. The approach to the imaging process described in the paper enables us to examine the dependence of the phase image on the surface geometry. Theoretical results are verified experimentally by means of a digital holographic microscope. |
| Databáze: | OpenAIRE |
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