Non-monotonic material contrast in scanning ion and scanning electron images
| Autor: | M. Utlaut, L.A. Giannuzzi |
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| Rok vydání: | 2011 |
| Předmět: |
Materials science
Scanning electron microscope media_common.quotation_subject Analytical chemistry Stopping power Focused ion beam Atomic and Molecular Physics and Optics Secondary electrons Electronic Optical and Magnetic Materials Ion Sputtering Contrast (vision) Atomic number Instrumentation media_common |
| Zdroj: | Ultramicroscopy. 111(11) |
| ISSN: | 1879-2723 |
| Popis: | 30 keV Ga + focused ion beam induced secondary electron (iSE) imaging was used to determine the relative contrast between several materials. The iSE signal compared from C, Si, Al, Ti, Cr, Ni, Cu, Mo, Ag, and W metal layers does not decrease with an increase in target atomic number Z 2 , and shows a non-monotonic relationship between contrast and Z 2 . The non-monotonic relationship is attributed to periodic fluctuations of the stopping power and sputter yield inherent to the ion–solid interactions. In addition, material contrast from electron-induced secondary electron (eSE) and backscattered electron (BSE) images using scanning electron microscopy (SEM) also shows non-monotonic contrast as a function of Z 2 , following the periodic behavior of the stopping power for electron–solid interactions. A comparison of the iSE and eSE results shows similar relative contrast between the metal layers, and not complementary contrast as conventionally understood. These similarities in the contrast behavior can be attributed to similarities in the periodic and non-monotonic function defined by incident particle–solid interaction theory. |
| Databáze: | OpenAIRE |
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