Methods for In Situ Electroluminescence Imaging of Photovoltaic Modules Under Varying Environmental Conditions
| Autor: | Dana B. Sulas-Kern, Hannah North, Peter Hacke, Michael Owen-Bellini, Sergiu Spataru, Greg Perrin |
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| Rok vydání: | 2020 |
| Předmět: |
Materials science
020209 energy 02 engineering and technology Electroluminescence Combined-accelerated stress testing Module characterization 0202 electrical engineering electronic engineering information engineering SDG 7 - Affordable and Clean Energy Electrical and Electronic Engineering DuraMAT business.industry Photovoltaic system Environmental chamber 021001 nanoscience & nanotechnology Condensed Matter Physics Electronic Optical and Magnetic Materials Characterization (materials science) Filter (video) Soldering Optoelectronics Degradation (geology) Current (fluid) 0210 nano-technology business |
| Zdroj: | Owen-Bellini, M, Sulas-Kern, D B, Perrin, G, North, H, Spataru, S & Hacke, P 2020, ' Methods for in Situ Electroluminescence Imaging of Photovoltaic Modules under Varying Environmental Conditions ', IEEE Journal of Photovoltaics, vol. 10, no. 5, pp. 1254-1261 . https://doi.org/10.1109/JPHOTOV.2020.3001723 |
| ISSN: | 2156-3403 2156-3381 |
| DOI: | 10.1109/jphotov.2020.3001723 |
| Popis: | Electroluminescence (EL) imaging is a powerful tool used to identify defects in photovoltaic solar cells. Typically, this type of characterization is performed in the dark using a current injection that equals short-circuit current measured at standard test conditions (STC). Restricting imaging to such a temperature range limits the information obtained about the module and cells. However, it is not trivial to develop a tool that would allow for EL imaging to be performed under a wider range of temperatures. Here we demonstrate an in situ EL imaging capability developed within an environmental chamber that allows for control of sample temperatures between-40 and 90 °C. Additionally, we demonstrate EL imaging of 4-cell mini-modules (MiMo) under front-side mechanical loading. A Raspberry Pi-connected camera with short-pass filter removed is used for EL imaging. The camera is low-cost with a small form-factor, appropriate for use in a harsh, enclosed environment. The camera is installed within a thermally isolating housing mounted within the environmental chamber. Three example cases are given for MiMos that exhibit various forms of degradation including solder fatigue and cell cracking. It is shown that by measuring at conditions above and below STC, different behaviors may be identified. In some cases, restricting characterization to STC may lead to a failure to detect damage existing in the sample. |
| Databáze: | OpenAIRE |
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