Gradient of Residual Stress and Lattice Parameter in Mechanically Polished Tungsten Measured Using Classical X-rays and Synchrotron Radiation
| Autor: | Mirosław Wróbel, Manuela Klaus, Andrzej Baczmanski, Marianna Marciszko-Wiąckowska, Kamila Kollbek, Christoph Genzel, Sebastian Wroński, Adrian Oponowicz |
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| Rok vydání: | 2020 |
| Předmět: |
010302 applied physics
Diffraction Materials science Isotropy Metallurgy Metals and Alloys Synchrotron radiation chemistry.chemical_element Large scale facilities for research with photons neutrons and ions 02 engineering and technology Tungsten 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Synchrotron law.invention Stress (mechanics) Lattice constant chemistry Mechanics of Materials Residual stress law 0103 physical sciences Composite material 0210 nano-technology |
| Zdroj: | Metallurgical and Materials Transactions A. 51:5945-5957 |
| ISSN: | 1543-1940 1073-5623 |
| DOI: | 10.1007/s11661-020-05967-y |
| Popis: | In this work, the stress gradient in mechanically polished tungsten sample was studied using X-ray diffraction methods. To determine in-depth stress evolution in the very shallow subsurface region (up to 10 μm), special methods based on reflection geometry were applied. The subsurface stresses (depth up to 1 μm) were measured using the multiple-reflection grazing incidence X-ray diffraction method with classical characteristic X-rays, while the deeper volumes (depth up to 10 μm) were investigated using energy-dispersive diffraction with white high energy synchrotron beam. Both complementary methods allowed for determining in-depth stress profile and the evolution of stress-free lattice parameter. It was confirmed that the crystals of tungsten are elastically isotropic, which simplifies the stress analysis and makes tungsten a suitable material for testing stress measurement methods. Furthermore, it was found that an important compressive stress of about − 1000 MPa was generated on the surface of the mechanically polished sample, and this stress decreases to zero value at the depth of about 9 μm. On the other hand, the strain-free lattice parameter does not change significantly in the examined subsurface region. |
| Databáze: | OpenAIRE |
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