A plastic electronic circuit based on low voltage, organic thin-film transistors for monitoring the X-Ray checking history of luggage in airports
| Autor: | Massimo Barbaro, Stefano Lai, Giulia Casula, Christophe Loussert, Franck D’Annunzio, Beatrice Fraboni, Laura Basiricò, Piero Cosseddu, Andrea Ciavatti, Vincent Fischer, Annalisa Bonfiglio |
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| Přispěvatelé: | Lai, Stefano, Casula, Giulia, Cosseddu, Piero, Basiricò, Laura, Ciavatti, Andrea, D'Annunzio, Franck, Loussert, Christophe, Fischer, Vincent, Fraboni, Beatrice, Barbaro, Massimo, Bonfiglio, Annalisa |
| Jazyk: | angličtina |
| Rok vydání: | 2018 |
| Předmět: |
Low voltage OFET
Computer science Circuit design 02 engineering and technology Condensed Matter Physic 010402 general chemistry 01 natural sciences law.invention Biomaterials Robustness (computer science) law Materials Chemistry Hardware_INTEGRATEDCIRCUITS Electrical and Electronic Engineering Electronic circuit RFID Materials Chemistry2506 Metals and Alloy business.industry Electronic Optical and Magnetic Material Transistor Detector Chemistry (all) Electrical engineering X-Rays detection General Chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics Chip Biomaterial 0104 chemical sciences Electronic Optical and Magnetic Materials Thin-film transistor Organic circuit 0210 nano-technology business Low voltage Simulation |
| Popis: | A circuit based on low voltage Organic Field-Effect Transistors (OFETs) and conceived for monitoring the security check history of luggage in airport environment is reported. An OFET-based, direct X-Rays detector is used as sensing element and integrated in an organic circuit for digitization and memorization of the X-Ray exposure event. An integrated interface to a commercial RFID chip and antenna is also realized to allow remote readout of the circuit status. The operation mechanism of the circuit is described and a complete explanation of the strategy adopted for circuit design is reported. Simulations of the systems in Cadence® Virtuoso environment are presented: X-Ray response of the sensor is modelled, and the overall functionality of the detection and memorization schema are demonstrated. Fabrication and characterization of the circuit under X-Rays in laboratory environment are described. In particular, the correct functionality of the circuit is demonstrated, as well as its actual capability in driving the commercial RFID tag system. The robustness of the circuit to aging and exposure to X-Rays in operation conditions is finally discussed. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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