Metrology and nano-mechanical tests for nano-manufacturing and nano-bio interface: Challenges & future perspectives

Autor: Syed A. M. Tofail, Marco Sebastiani, Dimitrios A. Dragatogiannis, Costas A. Charitidis, Christophe Silien, Edoardo Bemporad, Daniele De Felicis, Elias P. Koumoulos, Riccardo Moscatelli
Přispěvatelé: Koumoulos, E. P., Tofail, S. A. M., Silien, C., De Felicis, D., Moscatelli, R., Dragatogiannis, D. A., Bemporad, E., Sebastiani, M., Charitidis, C. A.
Jazyk: angličtina
Rok vydání: 2018
Předmět:
Zdroj: Materials & Design, Vol 137, Iss, Pp 446-462 (2018)
ISSN: 0264-1275
Popis: Nanometrology refers to measurement techniques that assess materials properties at the nanoscale. Laboratory-based characterisation of nanomaterials has been the key enabler in the growth of nanotechnology and nano-enabled products. Due to the small size involved, dimensional measurements has dominated such characterisation underpinned by a tremendous development in stand-alone electron/ion microscopes and scanning probe microscopes.However, the scope of nanometrology extends far beyond off-site, laboratory-based measurements of dimensions only, and is expected to have a tremendous impact on design of nano-enabled materials and devices.In this article, we discuss some of the available techniques for laboratory-based characterisation of mechanical and interfacial properties for nanometrology. We also provide a deep insight into the emerging techniques in measuring these properties, keeping in view the need in advanced manufacturing and nanobio-interactions to develop multifunctional instrumentation, traceable and standardized methods, and modelling tools for unambiguous data interpretation.We also discuss the evaluation of nanomechanical properties and surface/interface response of materials, within the purview of manufacturing processes and standardization.Finally, we discuss scientific and technological challenges that are required to move towards real-time nano-characterisation for rapid, reliable, repeatable and predictive metrology to underpin upscaling nanomaterials and nano-enabled products from the research field to industry and market. Keywords: Nanometrology, Nanoindentation, AFM, Bio, Microscopy, Nanoscopy
Databáze: OpenAIRE